Nanolane 
 

Nanolane Z.A. La Pécarditère
F-72450 Montfort le gesnois
tel: +33(0)243 540 900, fax: +33(0)243 540 909

SiO2 SURFMicroscope objective
Some examples

SURFs

Revolutionary all-around microscope slides

  • BREAKTHROUGH

    Turn your optical microscope into a nanoscope

  • SENSITIVITY

    Sense minute refractive index gradients

  • QUALITY CONTROL

    Instant nano-sample screening over macroscopic areas

  • MICRO-POSITIONING

    Easily locate isolated objects, regions of interest to be studied by SPM, Raman, XPS and so forth

  • MONITORING

    Sample physical integrity monitoring after laser, X-ray, e-beam exposure or SPM probe contact

 

PRINCIPLE

Anti-reflection substrates favouring the detection of material present at the surface through alteration of polarisation properties...

SURFs in ACTION

Use a SURF just like you would a run-of-the-mill glass slide or silicon wafer...

BENEFITS

Expand your optical microscope's usefulness to the nano-scale and get crisper micrographs...

Visit our broad range of SURFs, get a quote and order online...

Nanolane
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éolane
éolane COMBRÉE, Z.A. de l'Ombrée, Bd Jean-Baptiste Colbert, F-49520 Combrée, FRANCE éolane
SAS with € 2,000,000 share capital, 334 300 225 RCS Angers, France, VAT FR-33-334-300-225
AFM prelocalization - AFM, Raman, XPS, SIMS positioning - Analysis in liquid - Antibody - Biochip - Biosensor - Carbon Nanotube - Cell - Coating - Colloid - Copolymer film - Cristallization - Crystallite - Dip-coating - DNA - Dot - Graphene - In-situ analysis - Label-free imaging - Layer - Micro-positioning - Microscope slide - Monolayers - Nanolayer - Nano-lithography - Nanomaterials - Nano-objects localization - Nanopatterning - Nano sheet - Nanoscope - Nanotube - Nanostructures - Non contact measurement - Non-destructive testing - Optical characterization - Optical microscopy - Organelle - Quality control - RAMAN prelocalization - Rapid surface screening - Real-time analysis - Sample physical integrity - Sample substrate - SEEC - Self-assembled monolayers - Soft lithography - Spin-coating - Surface analysis - Surface Enhanced Ellipsometric Contrast - Thin film